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Proceedings Paper

Simulation analysis of space remote sensing image quality degradation induced by satellite platform vibration
Author(s): Feng Yang; Xiaofang Zhang; Yu Huang; Weiwei Hao; Baiwei Guo
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Paper Abstract

Satellite platform vibration causes the image quality to be degraded, it is necessary to study its influence on image quality. The forms of Satellite platform vibration consist of linear vibration, sinusoidal vibration and random vibration. Based on Matlab & Zemax, the simulation system has been developed for simulating impact caused by satellite platform vibration on image quality. Dynamic Data Exchange is used for the communication between Matlab and Zemax. The data of sinusoidal vibration are produced by sinusoidal curve with specific amplitude and frequency. The data of random vibration are obtained by combining sinusoidal signals with 10Hz, 100Hz and 200Hz’s frequency, 100, 12, 1.9’s amplitude and white noise with zero mean value. Satellite platform vibration data which produced by Matlab are added to the optical system, and its point spread function can be obtained by Zemax. Blurred image can be gained by making the convolution of PSF and the original image. The definition of the original image and the blurred image are evaluated by using average gradient values of image gray. The impact caused by the sine and random vibration of six DOFs on the image quality are respectively simulated. The simulation result reveal that the decenter of X-, Y-, Z- direction and the tilt of Z-direction have a little effect on image quality, while the tilt of X-, Y- direction make image quality seriously degraded. Thus, it can be concluded that correcting the error of satellite platform vibration by FSM is a viable and effective way.

Paper Details

Date Published: 26 November 2012
PDF: 9 pages
Proc. SPIE 8557, Optical Design and Testing V, 85570J (26 November 2012); doi: 10.1117/12.999441
Show Author Affiliations
Feng Yang, Beijing Institute of Technology (China)
Xiaofang Zhang, Beijing Institute of Technology (China)
Yu Huang, Beijing Institute of Technology (China)
Weiwei Hao, Beijing Institute of Technology (China)
Baiwei Guo, Beijing Institute of Technology (China)

Published in SPIE Proceedings Vol. 8557:
Optical Design and Testing V
Yongtian Wang; Chunlei Du; Hong Hua; Kimio Tatsuno; H. Paul Urbach, Editor(s)

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