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Proceedings Paper

Wave-front coded optical readout for the MEMS-based uncooled infrared imaging system
Author(s): Tian Li; Yuejin Zhao; Liquan Dong; Xiaohua Liu; Wei Jia; Mei Hui; Xiaomei Yu; Cheng Gong; Weiyu Liu
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Paper Abstract

In the space limited infrared imaging system based MEMS, the adjustment of optical readout part is inconvenient. This paper proposed a method of wave-front coding to extend the depth of focus/field of the optical readout system, to solve the problem above, and to reduce the demanding for precision in processing and assemblage of the optical readout system itself as well. The wave-front coded imaging system consists of optical coding and digital decoding. By adding a CPM (Cubic Phase Mask) on the pupil plane, it becomes non-sensitive to defocussing within an extended range. The system has similar PSFs and almost equally blurred intermediate images can be obtained. Sharp images are supposed to be acquired based on image restoration algorithms, with the same PSF as a decoding core.We studied the conventional optical imaging system, which had the same optical performance with the wave-front coding one for comparing. Analogue imaging experiments were carried out. And one PSF was used as a simple direct inverse filter, for imaging restoration. Relatively sharp restored images were obtained. Comparatively, the analogue defocussing images of the conventional system were badly destroyed. Using the decrease of the MTF as a standard, we found the depth of focus/field of the wave-front coding system had been extended significantly.

Paper Details

Date Published: 26 November 2012
PDF: 8 pages
Proc. SPIE 8557, Optical Design and Testing V, 85570U (26 November 2012); doi: 10.1117/12.999386
Show Author Affiliations
Tian Li, Beijing Institute of Technology (China)
Yuejin Zhao, Beijing Institute of Technology (China)
Liquan Dong, Beijing Institute of Technology (China)
Xiaohua Liu, Beijing Institute of Technology (China)
Wei Jia, Beijing Institute of Technology (China)
Beijing Teponteq Co., Ltd. (China)
Mei Hui, Beijing Institute of Techonolgy (China)
Xiaomei Yu, Peking Univ. (China)
Cheng Gong, Beijing Institute of Technology (China)
Weiyu Liu, Beijing Institute of Technology (China)

Published in SPIE Proceedings Vol. 8557:
Optical Design and Testing V
Yongtian Wang; Chunlei Du; Hong Hua; Kimio Tatsuno; H. Paul Urbach, Editor(s)

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