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Proceedings Paper

Add-drop filters based on asymmetric high-order microring resonators
Author(s): Dong Zhang; Yongqing Huang; Xiaomin Ren; Xiaofeng Duan; Bing Shen; Qi Wang; Xia Zhang; Shiwei Cai
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Paper Abstract

Add/drop filters are key components of Wavelength Division Multiplexing (WDM) communication systems. Free spectral range(FSR) is a key parameter for Add/drop filters, the FSR should operate within the entire C-band (1530-1562nm).And flat-top drop-port response with a sharp rolloff is also import, Flatness of the passband, sharp roll-off from passband to stop band are necessary to minimize the pulse broadening and the packing efficiency of wavelength channels. In this paper, we proposed an asymmetric approach to design high-order microring filters, The aim is to achieve large extension ratios and adequate suppression of the spurious interstitial mode, meanwhile, flat-top and steep-side response in filter could be obtained by this approach. Our simulation results showed an extended FSR of 40nm, reducing the interstitial peak suppression from 5dB to 35dB and a boxlike filter response with sharpe factor(SF) of 0.68. And a quality-factor of 2961 and a 3-dB bandwidth of 0.52nm is achieved.

Paper Details

Date Published: 27 November 2012
PDF: 7 pages
Proc. SPIE 8555, Optoelectronic Devices and Integration IV, 85550U (27 November 2012); doi: 10.1117/12.999382
Show Author Affiliations
Dong Zhang, Beijing Univ. of Posts and Telecommunications (China)
Yongqing Huang, Beijing Univ. of Posts and Telecommunications (China)
Xiaomin Ren, Beijing Univ. of Posts and Telecommunications (China)
Xiaofeng Duan, Beijing Univ. of Posts and Telecommunications (China)
Bing Shen, Beijing Univ. of Posts and Telecommunications (China)
Qi Wang, Beijing Univ. of Posts and Telecommunications (China)
Xia Zhang, Beijing Univ. of Posts and Telecommunications (China)
Shiwei Cai, Beijing Univ. of Posts and Telecommunications (China)


Published in SPIE Proceedings Vol. 8555:
Optoelectronic Devices and Integration IV
Xuping Zhang; Hai Ming; Joel M. Therrien, Editor(s)

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