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Proceedings Paper

Characteristics of super-RENS disks with various thickness of thermal protective layers
Author(s): Akira Sato; Junji Tominaga; Takashi Nakano; Hiroshi Fuji; Nobufumi Atoda
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Paper Abstract

Recently a super-resolution near-field structure (Super-RENS) has been proposed. A storage density of a conventional optical disk has been limited by the diffraction limit of the light. During the readout process of a Super-RENS, a small aperture is formed in a masklayer by a readout laser power. The mask layer is laid very close to a recording layer, and the aperture produced in the mask layer acts as an optical near-field probe. We have retrieved marks as small as 60 nm.

Paper Details

Date Published: 28 June 1999
PDF: 3 pages
Proc. SPIE 3864, Joint International Symposium on Optical Memory and Optical Data Storage 1999, 38641E (28 June 1999); doi: 10.1117/12.997591
Show Author Affiliations
Akira Sato, Minolta Co., Ltd. (Japan)
Junji Tominaga, National Institute for Advanced Interdisciplinary Research (Japan)
Takashi Nakano, National Institute for Advanced Interdisciplinary Research (Japan)
Hiroshi Fuji, Sharp Co. (Japan)
Nobufumi Atoda, National Institute for Advanced Interdisciplinary Research (Japan)


Published in SPIE Proceedings Vol. 3864:
Joint International Symposium on Optical Memory and Optical Data Storage 1999
Shigeo R. Kubota; Ryuichi Katayama; Douglas G. Stinson, Editor(s)

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