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Proceedings Paper

Polarization effect on signal from optical ROM using SIL
Author(s): K. Otaki; Hisao Osawa; Hiroshi Ooki; Jun Saito
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Paper Abstract

In high NA imaging systems such as Solid Immersion Lens ,incident angle is so large, and the polarization of incident beam is disturbed by passing through the SIL surface and by diffraction from the recording medium. Previously (ISOM'98) we reported the influence of polarization disturbance to the readout signals in phase change medium^. Here the same problem on the embossed mark is studied.

Paper Details

Date Published: 28 June 1999
PDF: 2 pages
Proc. SPIE 3864, Joint International Symposium on Optical Memory and Optical Data Storage 1999, 386411 (28 June 1999); doi: 10.1117/12.997571
Show Author Affiliations
K. Otaki, Nikon Corp. (Japan)
Hisao Osawa, Nikon Corp. (Japan)
Hiroshi Ooki, Nikon Corp. (Japan)
Jun Saito, Nikon Corp. (Japan)


Published in SPIE Proceedings Vol. 3864:
Joint International Symposium on Optical Memory and Optical Data Storage 1999
Shigeo R. Kubota; Ryuichi Katayama; Douglas G. Stinson, Editor(s)

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