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Proceedings Paper

Analyses of defect structure of surface layer of metals by use of mechanoluminescence
Author(s): Alexander F. Banishev; Vladislav Ya. Panchenko; Alexei V. Shishkov
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Proc. SPIE 3856, Internal Standardization and Calibration Architectures for Chemical Sensors, ; doi: 10.1117/12.997451
Show Author Affiliations
Alexander F. Banishev, Scientific Research Ctr. for Technological Lasers (Russia)
Vladislav Ya. Panchenko, Scientific Research Ctr. for Technological Lasers (Russia)
Alexei V. Shishkov, Scientific Research Ctr. for Technological Lasers (Russia)


Published in SPIE Proceedings Vol. 3856:
Internal Standardization and Calibration Architectures for Chemical Sensors
Ronald E. Shaffer; Radislav A. Potyrailo, Editor(s)

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