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Proceedings Paper

Portable Raman technique
Author(s): Mark Pavlosky
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Proc. SPIE 3851, Scientific Detection of Fakery in Art II, ; doi: 10.1117/12.997384
Show Author Affiliations
Mark Pavlosky, Renishaw, Inc. (United States)


Published in SPIE Proceedings Vol. 3851:
Scientific Detection of Fakery in Art II
Duane R. Chartier; Walter McCrone; Richard J. Weiss, Editor(s)

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