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Proceedings Paper

Characterization of a new promising technology for production of highest fullerenes
Author(s): Vladislav A. Ryzhkov; Boris A. Nechaev; Valery Z. Galeev
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Proc. SPIE 3790, Engineered Nanostructural Films and Materials, ; doi: 10.1117/12.996896
Show Author Affiliations
Vladislav A. Ryzhkov, Tomsk Polytechnic Univ. (Russia)
Boris A. Nechaev, Tomsk Polytechnic Univ. (Russia)
Valery Z. Galeev, Tomsk Polytechnic Univ. (Russia)


Published in SPIE Proceedings Vol. 3790:
Engineered Nanostructural Films and Materials
Akhlesh Lakhtakia; Russell F. Messier, Editor(s)

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