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Proceedings Paper

Thin film waveguides for applications in x-ray microscopy with submicron resolution
Author(s): Werner H. Jark; Silvia Di Fonzo; Alessia Cedola; Stefano Lagomarsino
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Proc. SPIE 3767, EUV, X-Ray, and Neutron Optics and Sources, ; doi: 10.1117/12.996702
Show Author Affiliations
Werner H. Jark, Sincrotrone Trieste (Italy)
Silvia Di Fonzo, Sincrotrone Trieste (Italy)
Alessia Cedola, European Synchrotron Radiation Facility (France) and CNR Istituto di Elettronica dello St (Italy)
Stefano Lagomarsino, CNR Istituto di Elettronica dello Stato Solido (Italy)


Published in SPIE Proceedings Vol. 3767:
EUV, X-Ray, and Neutron Optics and Sources
Carolyn A. MacDonald; Kenneth A. Goldberg; Juan R. Maldonado; Huaiyu Heather Chen-Mayer; Stephen P. Vernon, Editor(s)

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