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Proceedings Paper

Theoretical analysis on BISAR
Author(s): Ji Luo; Q. Z. Tian
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Proc. SPIE 3558, Automated Optical Inspection for Industry: Theory, Technology, and Applications II, ; doi: 10.1117/12.995164
Show Author Affiliations
Ji Luo, Beijing Institute of Technology (China)
Q. Z. Tian, Beijing Institute of Technology (China)


Published in SPIE Proceedings Vol. 3558:
Automated Optical Inspection for Industry: Theory, Technology, and Applications II
Shenghua Ye, Editor(s)

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