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Proceedings Paper

High-resolution zone plate x-ray microscope XM-1 at the Advanced Light Source
Author(s): Werner Meyer-Ilse; Hector Medecki; J. T. Brown; Erik H. Anderson; A. Nair
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Proc. SPIE 3449, X-Ray Microfocusing: Applications and Techniques, ; doi: 10.1117/12.994211
Show Author Affiliations
Werner Meyer-Ilse, Lawrence Berkeley National Lab. (United States)
Hector Medecki, Lawrence Berkeley National Lab. (United States)
J. T. Brown, Lawrence Berkeley National Lab. (United States)
Erik H. Anderson, Lawrence Berkeley National Lab. (United States)
A. Nair, Lawrence Berkeley National Lab. (United States)


Published in SPIE Proceedings Vol. 3449:
X-Ray Microfocusing: Applications and Techniques
Ian McNulty, Editor(s)

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