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Proceedings Paper

Soft x-ray optics for polarization-resolved magneto-optical measurements
Author(s): Jeffrey B. Kortright
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Date Published:
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Proc. SPIE 3448, Crystal and Multilayer Optics, ; doi: 10.1117/12.994203
Show Author Affiliations
Jeffrey B. Kortright, Lawrence Berkeley National Lab. (United States)


Published in SPIE Proceedings Vol. 3448:
Crystal and Multilayer Optics
Albert T. Macrander; Andreas K. Freund; Tetsuya Ishikawa; Dennis M. Mills, Editor(s)

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