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Proceedings Paper

Explanation for I-V characteristic's dependence on the top-electrode in thin film diode elements
Author(s): Hongwu Liu; Yuan Wu; Guozhang Zhao; Shuqing Fu; Kai Ma; Xinmin Huang
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Proc. SPIE 3297, Liquid Crystal Materials, Devices, and Applications VI, ; doi: 10.1117/12.992961
Show Author Affiliations
Hongwu Liu, Changchun Institute of Physics (China)
Yuan Wu, Changchun Institute of Physics (China)
Guozhang Zhao, Changchun Institute of Physics (China)
Shuqing Fu, Changchun Institute of Physics (China)
Kai Ma, Changchun Institute of Physics (United States)
Xinmin Huang, Changchun Institute of Physics (China)


Published in SPIE Proceedings Vol. 3297:
Liquid Crystal Materials, Devices, and Applications VI
Ranganathan Shashidhar, Editor(s)

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