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Proceedings Paper

Models and simulations of polarization signature phenomenology
Author(s): David B. Chenault; James Samuel Taylor; David R. Hayden
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Proc. SPIE 3121, Polarization: Measurement, Analysis, and Remote Sensing, ; doi: 10.1117/12.991661
Show Author Affiliations
David B. Chenault, Nichols Research Corp. (United States)
James Samuel Taylor, Nichols Research Corp. (United States)
David R. Hayden, Air Force Wright Lab. (United States)


Published in SPIE Proceedings Vol. 3121:
Polarization: Measurement, Analysis, and Remote Sensing
Dennis H. Goldstein; Russell A. Chipman, Editor(s)

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