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Proceedings Paper

Effects of end-spoiling variations on microchannel plate performance
Author(s): Bruce N. Laprade; Raymond C. Cochran; Francis Langevin; Mark W. Dykstra
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Proc. SPIE 3114, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy VIII, ; doi: 10.1117/12.991586
Show Author Affiliations
Bruce N. Laprade, Galileo Corp. (United States)
Raymond C. Cochran, Galileo Corp. (United States)
Francis Langevin, Galileo Corp. (United States)
Mark W. Dykstra, Galileo Corp. (United States)


Published in SPIE Proceedings Vol. 3114:
EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy VIII
Oswald H. W. Siegmund; Mark A. Gummin, Editor(s)

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