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Proceedings Paper

Testing and modeling the residual fixed-pattern noise of a HgCdTe focal plane array camera
Author(s): Pierre Lalande; Claudine D'hose
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Proc. SPIE 3063, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing VIII, ; doi: 10.1117/12.991370
Show Author Affiliations
Pierre Lalande, CEA-SEIM (France)
Claudine D'hose, CEA-SEIM (France)


Published in SPIE Proceedings Vol. 3063:
Infrared Imaging Systems: Design, Analysis, Modeling, and Testing VIII
Gerald C. Holst, Editor(s)

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