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Proceedings Paper

Pattern recognition of modal sensitivity for damage detection in bridges
Author(s): Jeong-Tae Kim; Bong-Hak Lee; Yeong-Hwa Chung; Je-Seon Park
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Proc. SPIE 3043, Smart Structures and Materials 1997: Smart Systems for Bridges, Structures, and Highways, ; doi: 10.1117/12.991234
Show Author Affiliations
Jeong-Tae Kim, Pukyong National Univ. (South Korea)
Bong-Hak Lee, Kangwon National Univ. (South Korea)
Yeong-Hwa Chung, Kangwon National Univ. (South Korea)
Je-Seon Park, Kangwon National Univ. (South Korea)


Published in SPIE Proceedings Vol. 3043:
Smart Structures and Materials 1997: Smart Systems for Bridges, Structures, and Highways
Norris Stubbs, Editor(s)

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