Share Email Print
cover

Proceedings Paper

Uniform detection in surface analysis by intense photoionization mass spectrometry
Author(s): Chun He; Christopher H. Becker
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Details

Date Published:
PDF
Proc. SPIE 2888, Laser Processing of Materials and Industrial Applications, ; doi: 10.1117/12.990181
Show Author Affiliations
Chun He, SRI International (United States)
Christopher H. Becker, SRI International (United States)


Published in SPIE Proceedings Vol. 2888:
Laser Processing of Materials and Industrial Applications
Shu-Sen Deng; S. C. Wang, Editor(s)

© SPIE. Terms of Use
Back to Top