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Influence of the native defects on the parameters of red, green and blue light-emitting thin films electroluminescent (TFEL) structures on the base of the alkaline-earth metal sulfides with rare-ear
Author(s): Alexander N. Gruzintsev
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Proc. SPIE 2875, Microelectronic Device and Multilevel Interconnection Technology II, ; doi: 10.1117/12.990055
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Alexander N. Gruzintsev, Institute of Microelectronics Technology (Russia)


Published in SPIE Proceedings Vol. 2875:
Microelectronic Device and Multilevel Interconnection Technology II
Ih-Chin Chen; Nobuo Sasaki; Divyesh N. Patel; Girish A. Dixit, Editor(s)

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