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Proceedings Paper

Soft x-ray measurements with large surface area avalanche photodiode
Author(s): Glenn Forrest; Alan Owens
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Date Published:
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Proc. SPIE 2808, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy VII, ; doi: 10.1117/12.989439
Show Author Affiliations
Glenn Forrest, Univ. of New Hampshire (United States)
Alan Owens, Univ. of Leicester (Netherlands)


Published in SPIE Proceedings Vol. 2808:
EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy VII
Oswald H. W. Siegmund; Mark A. Gummin, Editor(s)

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