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Comparison of array architectures for measurand mapping over a surface
Author(s): A. Bruce Buckman; Rodger M. Walser; Michael F. Becker
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Proc. SPIE 2718, Smart Structures and Materials 1996: Smart Sensing, Processing, and Instrumentation, ; doi: 10.1117/12.989024
Show Author Affiliations
A. Bruce Buckman, Univ. of Texas/Austin (United States)
Rodger M. Walser, Univ. of Texas/Austin (United States)
Michael F. Becker, Univ. of Texas/Austin (United States)


Published in SPIE Proceedings Vol. 2718:
Smart Structures and Materials 1996: Smart Sensing, Processing, and Instrumentation
Kent A. Murphy; Dryver R. Huston, Editor(s)

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