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Proceedings Paper

Perspective of silicon-based IC technology
Author(s): Yoshio Nishi
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Proc. SPIE 2635, Microelectronic Manufacturing Yield, Reliability, and Failure Analysis, ; doi: 10.1117/12.988309
Show Author Affiliations
Yoshio Nishi, Texas Instruments, Inc. (United States)


Published in SPIE Proceedings Vol. 2635:
Microelectronic Manufacturing Yield, Reliability, and Failure Analysis
Gopal Rao; Massimo Piccoli, Editor(s)

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