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Selective sensitivity of a-Si/c-Si based uncooled IR detector prepared by RF magnetron sputtering technique
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Proc. SPIE 2554, Growth and Characterization of Materials for Infrared Detectors II, ; doi: 10.1117/12.987819
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Published in SPIE Proceedings Vol. 2554:
Growth and Characterization of Materials for Infrared Detectors II
Randolph E. Longshore; Jan W. Baars; Avishai Kepten; John M. Trombetta, Editor(s)

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