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Proceedings Paper

Fresh approach to the temperature sensitivity of threshold current of a 1.3-1.5 micron diode laser
Author(s): Alexander P. Bogatov
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Proc. SPIE 2399, Physics and Simulation of Optoelectronic Devices III, ; doi: 10.1117/12.986778
Show Author Affiliations
Alexander P. Bogatov, P.N. Lebedev Physics Institute (Russia)


Published in SPIE Proceedings Vol. 2399:
Physics and Simulation of Optoelectronic Devices III
Marek Osinski; Weng W. Chow, Editor(s)

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