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Proceedings Paper

Correlation of observer performance with a family of thermal clutter measures
Author(s): James D. Silk
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Proc. SPIE 2224, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing V, ; doi: 10.1117/12.985799
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James D. Silk, Institute for Defense Analysis (United States)


Published in SPIE Proceedings Vol. 2224:
Infrared Imaging Systems: Design, Analysis, Modeling, and Testing V
Gerald C. Holst, Editor(s)

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