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Proceedings Paper

Device working on the light principle for surface-roughness measurement
Author(s): Josef Mandak
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Proc. SPIE 2066, Industrial Optical Sensing and Metrology: Applications and Integration, ; doi: 10.1117/12.984866
Show Author Affiliations
Josef Mandak, CzMTC (Czech Republic)


Published in SPIE Proceedings Vol. 2066:
Industrial Optical Sensing and Metrology: Applications and Integration
Kevin G. Harding; H. Philip Stahl, Editor(s)

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