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Proceedings Paper

Reflectance of and manufacturing concerns for MIL-F-495 Cu-black process
Author(s): Isabella T. Lewis; William A. Rice
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Proc. SPIE 1995, Optical Scattering: Applications, Measurement, and Theory II, ; doi: 10.1117/12.984464
Show Author Affiliations
Isabella T. Lewis, Lawrence Livermore National Lab. (United States)
William A. Rice, Lawrence Livermore National Lab. (United States)


Published in SPIE Proceedings Vol. 1995:
Optical Scattering: Applications, Measurement, and Theory II
John C. Stover, Editor(s)

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