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Proceedings Paper

SIMIS--a new simulation model for analysis of infrared scenes
Author(s): Kurt R. Beier
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Proc. SPIE 1967, Characterization, Propagation, and Simulation of Sources and Backgrounds III, ; doi: 10.1117/12.984404
Show Author Affiliations
Kurt R. Beier, DLR Institut fuer Optoelektronik (Germany)


Published in SPIE Proceedings Vol. 1967:
Characterization, Propagation, and Simulation of Sources and Backgrounds III
Wendell R. Watkins; Dieter Clement, Editor(s)

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