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Proceedings Paper

Expert system for automatic defect classification in machine vision
Author(s): Anthony Kehoe
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Proc. SPIE 1907, Machine Vision Applications in Industrial Inspection, ; doi: 10.1117/12.984077
Show Author Affiliations
Anthony Kehoe, Univ. of Surrey (United Kingdom)


Published in SPIE Proceedings Vol. 1907:
Machine Vision Applications in Industrial Inspection
Frederick Y. Wu; Benjamin M. Dawson, Editor(s)

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