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Proceedings Paper

Optimal design of high frequency readout IC for short-wave IRFPA
Author(s): Pan Wang; Guo-qiang Chen; Lei Gao; Jie Zhou; Rui-jun Ding
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Paper Abstract

High frequency readout-integrated circuit(ROIC) of 512×256 staring short wavelength(SW) infrared focal plane arrays(IRFPAs), focusing on high-frame rate output and noise suppression is implemented in this paper. The design of ROIC mentioned in it takes the previous version into account. The complete analog signal chain contains a novel input stage of capacitor feedback transimpedance amplifier(CTIA) preamplifier, a CDS (correlated double sampling) module, an amplifier of charge and complementary output stage. This ROIC is a full-custom flow integrated circuit design. The parasitic parameters are extracted once the layout is finished. Then the design is improved according to the result of post-layout simulation, which leads to the great improvements of the majority of parameters. The test and simulation results show that the output voltage range is 2.8V, the frame rate is 250Hz and the linearity within useful voltage range is above 99.1 percent, even when the temperature is 77K.

Paper Details

Date Published: 5 December 2012
PDF: 8 pages
Proc. SPIE 8562, Infrared, Millimeter-Wave, and Terahertz Technologies II, 85621P (5 December 2012); doi: 10.1117/12.982015
Show Author Affiliations
Pan Wang, Shanghai Institute of Technical Physics (China)
Graduate Univ. of the Chinese Acedemy of Sciences (China)
Guo-qiang Chen, Shanghai Institute of Technical Physics (China)
Graduate Univ. of the Chinese Acedemy of Sciences (China)
Lei Gao, Shanghai Institute of Technical Physics (China)
Graduate Univ. of the Chinese Acedemy of Sciences (China)
Jie Zhou, Shanghai Institute of Technical Physics (China)
Graduate Univ. of the Chinese Acedemy of Sciences (China)
Rui-jun Ding, Shanghai Institute of Technical Physics (China)


Published in SPIE Proceedings Vol. 8562:
Infrared, Millimeter-Wave, and Terahertz Technologies II
Cunlin Zhang; Xi-Cheng Zhang; He Li; Sheng-Cai Shi, Editor(s)

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