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Proceedings Paper

An overview of turbulence compensation
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Paper Abstract

In general, long range visual detection, recognition and identification are hampered by turbulence caused by atmospheric conditions. Much research has been devoted to the field of turbulence compensation. One of the main advantages of turbulence compensation is that it enables visual identification over larger distances. In many (military) scenarios this is of crucial importance. In this paper we give an overview of several software and hardware approaches to compensate for the visual artifacts caused by turbulence. These approaches are very diverse and range from the use of dedicated hardware, such as adaptive optics, to the use of software methods, such as deconvolution and lucky imaging. For each approach the pros and cons are given and it is indicated for which type of scenario this approach is useful. In more detail we describe the turbulence compensation methods TNO has developed in the last years and place them in the context of the different turbulence compensation approaches and TNO’s turbulence compensation roadmap. Furthermore we look forward and indicate the upcoming challenges in the field of turbulence compensation.

Paper Details

Date Published: 19 November 2012
PDF: 10 pages
Proc. SPIE 8542, Electro-Optical Remote Sensing, Photonic Technologies, and Applications VI, 85420O (19 November 2012); doi: 10.1117/12.981942
Show Author Affiliations
Klamer Schutte, TNO Defence, Security and Safety (Netherlands)
Adam W. M. van Eekeren, TNO Defence, Security and Safety (Netherlands)
Judith Dijk, TNO Defence, Security and Safety (Netherlands)
Piet B. W. Schwering, TNO Defence, Security and Safety (Netherlands)
Miranda van Iersel, TNO Defence, Security and Safety (Netherlands)
Niek J. Doelman, TNO Defence, Security and Safety (Netherlands)


Published in SPIE Proceedings Vol. 8542:
Electro-Optical Remote Sensing, Photonic Technologies, and Applications VI
Gary W. Kamerman; Ove Steinvall; Gary J. Bishop; John Gonglewski; Mark T. Gruneisen; Miloslav Dusek; John G. Rarity; Keith L. Lewis; Richard C. Hollins; Thomas J. Merlet, Editor(s)

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