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Proceedings Paper

Numerical simulation of polarization dependent characteristics of the structured thin-films phase grating
Author(s): Yi Yu Li; Chuan Hu; Yu Chen Wu; Hai Hua Feng; Jiao Jie Chen
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Paper Abstract

Diffraction efficiency of the structured thin-films phase grating (STFPG) at the visible wavelength is analyzed by the rigorous coupled wave analysis (RCWA) method demonstrating that the TM polarization can be separated from the 0th transmitted order of the TE polarization by ±1st order diffraction. The far field diffraction pattern is simulated by the finite-difference time-domain (FDTD) method to show the polarization beam splitting effect of the STFPG at wavelength of 633nm. In the near field, polarization dependent Talbot effect of the STFPG is also elaborated. FDTD simulations reveal that the spatial distribution of the interference fringes forming the self-image can be shifted by a half of grating period by changing the incident wave polarization within a particular wavelength range.

Paper Details

Date Published: 26 November 2012
PDF: 8 pages
Proc. SPIE 8556, Holography, Diffractive Optics, and Applications V, 85561D (26 November 2012); doi: 10.1117/12.981858
Show Author Affiliations
Yi Yu Li, Wenzhou Medical College (China)
Chuan Hu, Wenzhou Medical College (China)
Yu Chen Wu, Wenzhou Medical College (China)
Hai Hua Feng, Wenzhou Medical College (China)
Jiao Jie Chen, Wenzhou Medical College (China)

Published in SPIE Proceedings Vol. 8556:
Holography, Diffractive Optics, and Applications V
Yunlong Sheng; Chongxiu Yu; Linsen Chen, Editor(s)

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