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Proceedings Paper

Tip-enhanced Raman spectroscopy: application to the study of single silicon nanowire and functionalized gold surface
Author(s): Nastaran Kazemi-Zanjani; Farshid Pashaee; François Lagugné-Labarthet
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Paper Abstract

Tip-Enhanced Raman spectroscopy is used to probe isolated silicon nanowires and functionalized gold surface with the goal to evaluate the improvements in lateral resolution and surface sensitivity of this method. The setup that involves the combination of and atomic force microscope and a confocal microscope in back-scattering geometry is described together with the optical alignment procedure used to ideally excite the localized surface plasmon of the metallized tip that acts as the nanoprobe. Once aligned, the tip, in feedback with the sample surface, is positioned at a given point and the Raman spectrum is acquired. The sample is then scanned point-by-point and a TERS map is generated for the object or surface of interest. This approach shows an improved lateral spatial resolution for the single silicon nanowires together with relevant information on the induced stress on the nanowire. Last, we show that the proximity of the TERS tip over an ultraflat gold nanoplate functionalized with an azobenzene thiol molecule, largely enhance the vibrational signal from a single monolayer.

Paper Details

Date Published: 24 October 2012
PDF: 9 pages
Proc. SPIE 8412, Photonics North 2012, 841220 (24 October 2012); doi: 10.1117/12.981727
Show Author Affiliations
Nastaran Kazemi-Zanjani, Univ. of Western Ontario (Canada)
Farshid Pashaee, Univ. of Western Ontario (Canada)
François Lagugné-Labarthet, Univ. of Western Ontario (Canada)

Published in SPIE Proceedings Vol. 8412:
Photonics North 2012
Jean-Claude Kieffer, Editor(s)

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