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Proceedings Paper

Chromatic information coding in optical systems for hyperspectral imaging and chromatic confocal sensing
Author(s): M. Hillenbrand; A. Grewe; M. Bichra; B. Mitschunas; R. Kirner; R. Weiß; S. Sinzinger
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Paper Abstract

Dispersion causes the focal lengths of refractive and diffractive optical elements to vary with wavelength. In our contribution we show how it can be used for chromatic encoding and decoding of optical signals. We specifically discuss how these concepts can be applied for the implementation of systems with applications in the growing fields of hyperspectral imaging and chromatic distance coding. Refractive systems as well as hybrid combinations of diffractive and refractive elements are used to create specific chromatic aberrations of the sensors. Our design approach enables the tailoring of the sensor properties to the measurement problem and assists designers in finding optimized solutions for industrial applications. The focus of our research is on parallelized imaging systems that cover extended objects. In comparison to point sensors, such systems promise reduced image acquisition times and an increased overall performance. Concepts for three-dimensional profilometry with chromatic confocal sensor systems as well as spectrally resolved imaging of object scenes are discussed.

Paper Details

Date Published: 18 December 2012
PDF: 10 pages
Proc. SPIE 8550, Optical Systems Design 2012, 85500D (18 December 2012); doi: 10.1117/12.981147
Show Author Affiliations
M. Hillenbrand, Technische Univ. Ilmenau (Germany)
A. Grewe, Technische Univ. Ilmenau (Germany)
M. Bichra, Technische Univ. Ilmenau (Germany)
B. Mitschunas, Technische Univ. Ilmenau (Germany)
R. Kirner, Technische Univ. Ilmenau (Germany)
R. Weiß, Technische Univ. Ilmenau (Germany)
S. Sinzinger, Technische Univ. Ilmenau (Germany)


Published in SPIE Proceedings Vol. 8550:
Optical Systems Design 2012
Laurent Mazuray; Rolf Wartmann; Andrew P. Wood; Marta C. de la Fuente; Jean-Luc M. Tissot; Jeffrey M. Raynor; Daniel G. Smith; Frank Wyrowski; Andreas Erdmann; Tina E. Kidger; Stuart David; Pablo Benítez, Editor(s)

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