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Proceedings Paper

Gaussian beam Z-scan analysis for nonlinear optical materials possessing simultaneous third- and fifth-order nonlinear refraction with saturable absorption: an application to semiconductor CdSe quantum dot-polymer nanocomposites
Author(s): Yasuo Tomita; Xiangming Liu; Yusuke Adachi
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Paper Abstract

We present a theoretical analysis of the closed-aperture Gaussian beam Z-scan for nonlinear optical materials with both saturable absorption and simultaneous third- and fifth-order nonlinear refraction. We formulate a theoretical expression for the Z-scan transmittance by means of the Adomian’s decomposition method and the thin film approximation. It is applied to the experimental characterization of the nonlinear optical properties of a semiconductor CdSe quantum dot-polymer nanocomposite film. We show that measured results of the open- and closed-aperture Z-scan transmittances of the nanocomposite film are well explained by the theoretical model.

Paper Details

Date Published: 18 December 2012
PDF: 11 pages
Proc. SPIE 8550, Optical Systems Design 2012, 85503G (18 December 2012); doi: 10.1117/12.979824
Show Author Affiliations
Yasuo Tomita, The Univ. of Electro-Communications (Japan)
Xiangming Liu, The Univ. of Electro-Communications (Japan)
Yusuke Adachi, The Univ. of Electro-Communications (Japan)

Published in SPIE Proceedings Vol. 8550:
Optical Systems Design 2012
Laurent Mazuray; Rolf Wartmann; Andrew P. Wood; Marta C. de la Fuente; Jean-Luc M. Tissot; Jeffrey M. Raynor; Daniel G. Smith; Frank Wyrowski; Andreas Erdmann; Tina E. Kidger; Stuart David; Pablo Benítez, Editor(s)

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