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Proceedings Paper

Time of flight secondary ion mass spectrometry examination of ancient and historical opaque glasses
Author(s): Chloë N. Duckworth; Julian Henderson; Frank J. M. Rutten
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Paper Abstract

This paper presents recent work done on the application of Time of Flight Secondary Ion Mass Spectrometry (ToFSIMS), a high lateral resolution surface analysis technique, to the study of opacifying inclusions in ancient and historical glasses. A small selection of ancient glass samples have thus far been analyzed by this technique with great success. The combination of surface sensitivity and high lateral resolution offered by the technique is uniquely placed to address the detailed chemical composition of the opacifying inclusions themselves, without interference from the surrounding glass matrix. The research team seeks to further develop the use of ToF-SIMS for addressing issues of provenance and understanding the technological processes involved in adding opacifying inclusions to ancient glass, through further analysis of relevant material and through the production and analysis of replica opaque glasses. The technique itself will be discussed along with some of the preliminary results obtained and proposals for future work in this field.

Paper Details

Date Published: 7 November 2012
PDF: 9 pages
Proc. SPIE 8422, Integrated Approaches to the Study of Historical Glass, 84220G (7 November 2012); doi: 10.1117/12.979791
Show Author Affiliations
Chloë N. Duckworth, Univ. of Nottingham (United Kingdom)
Julian Henderson, Univ. of Nottingham (United Kingdom)
Frank J. M. Rutten, Keele Univ. (United Kingdom)

Published in SPIE Proceedings Vol. 8422:
Integrated Approaches to the Study of Historical Glass
Hugo Thienpont; Wendy Meulebroeck; Karin Nys; Dirk Vanclooster, Editor(s)

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