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Proceedings Paper • Open Access

Front Matter: Volume 8378
Author(s): Proceedings of SPIE

Paper Abstract

This PDF file contains the front matter associated with SPIE Proceedings Volume 8378, including the Title Page; Copyright information; Table of Contents; Introduction; Introduction to Special Session on Microscopy for Science, Technology, Engineering and Math (STEM) Educators, and the Conference Committee listing.

Paper Details

Date Published: 14 May 2012
PDF: 12 pages
Proc. SPIE 8378, Scanning Microscopies 2012: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences, 837801 (14 May 2012); doi: 10.1117/12.979457
Show Author Affiliations
Proceedings of SPIE, SPIE (United States)


Published in SPIE Proceedings Vol. 8378:
Scanning Microscopies 2012: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences
Michael T. Postek; Dale E. Newbury; S. Frank Platek; David C. Joy; Tim K. Maugel, Editor(s)

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