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Proceedings Paper

Research of processing method for infrared image of sandwich structure composite
Author(s): Yan Huo; Cun-Lin Zhang; Chun-Yu Hu; Chun-Guang Li
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Paper Abstract

Composite sandwich structure has been widely used in aerospace due to its lightweight, high stiffness and strength. Existence of delaminations in the structure reduce the performance of the composites significantly, such flaws can be detected effectively and non-destructively by non-contact pulsed infrared thermography, but the contrast of infrared images of the material is low due to complex structure, so delaminations and sound area are difficult to be differentiated. In this paper, sandwich structure composites with aluminum facesheet and aluminum honeycomb cores are chosen as study objectives, several round-shape and rectangle-shape Teflon inserts with different sizes embedded in specimen, which simulate delaminations in the structure, and the processing method of infrared image is developed. The thermal image is processed through image denoising, image enhancement and feature extraction, and then the sizes of the defects are determined. Refer to the designed sizes, the results show that the accuracy of sizes measured by image processing is more than 90% for the defects bigger than Φ10mm , these results demonstrated that detecting accuracy of the structure is higher by infrared image processing.

Paper Details

Date Published: 15 October 2012
PDF: 5 pages
Proc. SPIE 8417, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 84170K (15 October 2012); doi: 10.1117/12.978926
Show Author Affiliations
Yan Huo, Beihang Univ. (China)
Cun-Lin Zhang, Capital Normal Univ. (China)
Chun-Yu Hu, Beijing SG-CEPRI UHV Transmission Technology Co. Ltd. (China)
Chun-Guang Li, China Academy of Civil Aviation Science and Technology (China)


Published in SPIE Proceedings Vol. 8417:
6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; Libin Xiang; Sandy To, Editor(s)

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