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Proceedings Paper

Reversible Phase Change Sb-Te Films For Optical Disk
Author(s): Hiroki Yamazaki; Shogo Yagi; Susumu Fujimori; Nobuhiro Funakoshi
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Paper Abstract

Methods for testing amorphous life, erasing rate and amorphizing sensitivity in situ are presented. SbxTe1-x films are characterized using these methods and it is shown that the fastest erasing rate and the longest amorphous life can be achieved at almost the same compositional value of x = 0.4. Sb-Te disk properties are studied with a one-beam head whose focused beam diameter is 1.4 μm. The carrier-to-noise ratio for 1.0 μm diameter amorphous marks recorded at a mark pitch of 2.5 pm is 47 dB. An investigation of erasing performance with the circularly focused beam revealed that the crystallization rate is fastest at a temperature comparatively lower than the melting temperature.

Paper Details

Date Published: 1 January 1987
PDF: 4 pages
Proc. SPIE 0818, Current Developments in Optical Engineering II, (1 January 1987); doi: 10.1117/12.978892
Show Author Affiliations
Hiroki Yamazaki, NTT Electrical Communications Laboratories (Japan)
Shogo Yagi, NTT Electrical Communications Laboratories (Japan)
Susumu Fujimori, NTT Electrical Communications Laboratories (Japan)
Nobuhiro Funakoshi, NTT Electrical Communications Laboratories (Japan)


Published in SPIE Proceedings Vol. 0818:
Current Developments in Optical Engineering II
Robert E. Fischer; Warren J. Smith, Editor(s)

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