Share Email Print
cover

Proceedings Paper

Wall thickness detection based on x-ray image processing technology
Author(s): Lei Zhang; Guoyu Zhang; Jiang Yu; Wu Kui
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

This paper analyzes the cause and characteristics of noises in low intensity X-ray real-time imaging system with X-ray image intensifier. According to the human visual characteristics and image characteristics of the measured object, signal to noise reduction and superposition enhancement of the gray-scale image are used to reduce the image noise so that high-quality real-time image processing can be realized. With the smoothing filter to process the image edge and the using of edge extraction algorithm, the limit of contrast sensitivity threshold for human eye is broken through and high-precision edge recognition is achieved in low contrast images. The paper also analyzes projection error of the projection imaging and presents the scheme of segmented variable magnification factor compensation, so that measurement accuracy can reach 0.1mm.

Paper Details

Date Published: 15 October 2012
PDF: 5 pages
Proc. SPIE 8417, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 841722 (15 October 2012); doi: 10.1117/12.978835
Show Author Affiliations
Lei Zhang, Changchun Univ. of Science and Technology (China)
Guoyu Zhang, Changchun Univ. of Science and Technology (China)
Jiang Yu, Changchun Univ. of Science and Technology (China)
Wu Kui, Changchun Univ. of Science and Technology (China)


Published in SPIE Proceedings Vol. 8417:
6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; Libin Xiang; Sandy To, Editor(s)

© SPIE. Terms of Use
Back to Top