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Proceedings Paper

Research of optical electric field probe
Author(s): Wan Zhang; Bin Li; Jingyao Chen; Jifeng Wang; Guizhen Lu
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Paper Abstract

As an important modern measurement equipment of the electromagnetic field, electric field probe can measure the industrial, scientific and medical aspects of the leakage field. In the Electro Magnetic Compatibility (EMC) experiment, it can also check the high-frequency-sensitive parts of the devices and the parasitic radiations due to the mechanical movement. Especially in the field of Electromagnetic Compatibility, electric field probe is one of the most important test equipment. This paper introduces a type of optical electric field probe. In the system, a kind of antenna, which could provide a response nearly isotropic for all polarizations of the incident field, is used for receiving the signal of the electric field. The high-frequency signal received by the antenna then is detected by Schottky barrier diode detector. This low-frequency or Direct Current (DC) signal can be modulated to the band of light by the Electro-Absorption-Distributed Feed Back (EA-DFB) modulator, thus the probe can provide a wild band responds. Through the optical fiber, the optical signal is sent to the photoelectric detector. Based on the optical power value, the field intensity can be calculated. In this system, compared with traditional transmission line, optical fiber can minimize the electromagnetic interference and transmission-line attenuation. In addition to this, the system also has high test sensitivity and wide measurement bandwidth. Furthermore, the whole system has a simple structure and low manufacturing cost.

Paper Details

Date Published: 15 October 2012
PDF: 6 pages
Proc. SPIE 8419, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Sensing, Imaging, and Solar Energy, 84192S (15 October 2012); doi: 10.1117/12.978698
Show Author Affiliations
Wan Zhang, Communication Univ. of China (China)
Bin Li, Communication Univ. of China (China)
Jingyao Chen, Communication Univ. of China (China)
Jifeng Wang, Communication Univ. of China (China)
Guizhen Lu, Communication Univ. of China (China)


Published in SPIE Proceedings Vol. 8419:
6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Sensing, Imaging, and Solar Energy
Yadong Jiang; Junsheng Yu; Zhifeng Wang, Editor(s)

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