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Proceedings Paper

Microchannel Detection of Microfluidic Chips with Digital Holography Imaging System
Author(s): Yunxin Wang; Dayong Wang; Dengcai Yang; Liting Ouyang; Jie Zhao; Panezai Spozmai
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Paper Abstract

The quality of the microfluidic chip will influence the separations, injections, reactions and measurements of samples in the microfluidic system, it is essential to detect the structure such as the width, depth and roughness for evaluating its performance. Aiming at this requirement, digital holography microscope method is developed to achieve the quantitative, non-contact phase imaging with the full field. Firstly, the digital image plane holographic microscopy is designed, and the complex amplitude of the whole wave field is reconstructed by the angular spectrum method. The two-step phase subtraction and surface fitting methods are combined to eliminate the phase aberration, and the unwrapped phase information is extracted using the least-squares phase-unwrapping algorithm. Meanwhile, we acquire the profile parameters of the microchannel using white light interferometer, and the results demonstrate that the digital image plane holographic microscopy is feasible and effective for the profile measurement of microchannels in the microfluidic chip.

Paper Details

Date Published: 15 October 2012
PDF: 6 pages
Proc. SPIE 8418, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Design, Manufacturing, and Testing of Smart Structures, Micro- and Nano-Optical Devices, and Systems, 841816 (15 October 2012); doi: 10.1117/12.978641
Show Author Affiliations
Yunxin Wang, Beijing Univ. of Technology (China)
Dayong Wang, Beijing Univ. of Technology (China)
Dengcai Yang, Beijing Univ. of Technology (China)
Liting Ouyang, Beijing Univ. of Technology (China)
Jie Zhao, Beijing Univ. of Technology (China)
Panezai Spozmai, Beijing Univ. of Technology (China)


Published in SPIE Proceedings Vol. 8418:
6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Design, Manufacturing, and Testing of Smart Structures, Micro- and Nano-Optical Devices, and Systems
Tianchun Ye; Song Hu; Yanqiu Li; Xiangang Luo; Xiaoyi Bao, Editor(s)

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