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Proceedings Paper

Wide Band Imaging Spectrometer
Author(s): Howard C. Borough; Michael Wilke
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Paper Abstract

An imaging spectrometer and associated data processor has been developed which, when fully implemented, will provide a wide (0.4 to 11 micrometer) spectral region coverage with very narrow (hyperspectral) image acquisition capability. The instrument has a field of view of just less than one degree and a pixel IFOV of 27 microradians in the visible - near infrared. The spectral sample dimension is 0.002 micrometers in the visible - near infrared. The instrument is described and the first field test of the short wavelength (0.4 to 2 micrometer) breadboard on the Navy Long Jump III measurement program is reviewed.

Paper Details

Date Published: 8 January 1990
PDF: 8 pages
Proc. SPIE 1157, Infrared Technology XV, (8 January 1990); doi: 10.1117/12.978619
Show Author Affiliations
Howard C. Borough, Boeing Aerospace & Electronics (United States)
Michael Wilke, Boeing Aerospace & Electronics (United States)

Published in SPIE Proceedings Vol. 1157:
Infrared Technology XV
Irving J. Spiro, Editor(s)

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