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Proceedings Paper

A Study On Pixel Defect Compensation For Staring Focal Plane Arrays
Author(s): Larry Rystrom
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Paper Abstract

The staring infrared focal plane arrays used by Boeing in some applications have large numbers of pixels that are unusable due to variations in detector sensitivity. Values for these defective pixels may be estimated from the neighborhood of surrounding pixels. A linear model of an image is used to determine an RMS error associated with each kind of defect compensation. The RMS error was minimized by median filtering; however, averaging nondefective neighboring pixels and substituting one neighboring pixel at random also produced low errors. Simulation results verifying the study are also presented.

Paper Details

Date Published: 8 January 1990
PDF: 17 pages
Proc. SPIE 1157, Infrared Technology XV, (8 January 1990); doi: 10.1117/12.978602
Show Author Affiliations
Larry Rystrom, Boeing Electronics (United States)


Published in SPIE Proceedings Vol. 1157:
Infrared Technology XV
Irving J. Spiro, Editor(s)

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