Share Email Print
cover

Proceedings Paper

Absolute Reflectance Measurements Of Metallic Surfaces In The 0.8-5.5µm Region
Author(s): D. Sheffer; U. P. Oppenheim; A. D. Devir
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

An absolute reflectometer for the 0.8 - 5.5 microns region is described, and reflectance spectra for some diffuse metallic surfaces are given. Some of the spectra show a dip of 5-7% in the reflectance values of the surfaces in the 3.0 - 3.5 microns region. Possible causes for the observed dips are discussed.

Paper Details

Date Published: 8 January 1990
PDF: 12 pages
Proc. SPIE 1157, Infrared Technology XV, (8 January 1990); doi: 10.1117/12.978579
Show Author Affiliations
D. Sheffer, Technion Research and Development Foundation Ltd. (Israel)
U. P. Oppenheim, Technion Research and Development Foundation Ltd. (Israel)
A. D. Devir, Technion Research and Development Foundation Ltd. (Israel)


Published in SPIE Proceedings Vol. 1157:
Infrared Technology XV
Irving J. Spiro, Editor(s)

© SPIE. Terms of Use
Back to Top