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Proceedings Paper

Intense Electron Beam Cyclotron Masers With Microsecond Pulselengths
Author(s): R. M. Gilgenbach; J. G. Wang; J. J. Choi; C. A. Outten; T. A. Spencer
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Paper Abstract

Experiments have been performed in which MW microwave power levels have been produced by means of the cyclotron maser resonance on high current, relativistic electron beams from a generator with parameters: 0.4 MV,1.2 kA, and 0.4 gs. In the first series of experiments, a nonadiabatic dip in the magnetic field imparted large ratios of perpendicular to parallel momentum (a >1) in a transported beam current of typically 20 - 60 A. X-Band microwave power (>0.6 MW) was sustained over nearly the full e-beam pulselength and 85% variation in electron beam generator voltage. In more recent experiments, MW power levels in X-band have been generated using an improved magnetic field profile which increased the transported electron beam current to 500 - 1000 A, but with lower a (0.2 -0.3). A wiggler has been utilized to increase the ratio of perpendicular to parallel momentum. Data show a strong (up to a factor of 40) enhancement in peaks of K-band microwaves when the e-beam energy is near a resonance condition with the wiggler. Design studies are underway for a multimegawatt, microsecond, intense electron beam cyclotron maser which will operate on the Michigan Electron Long Beam Accelerator (MELBA) at parameters: 0.7-1 MV, 1-10 kA, and voltage compensated pulselength of 1-1.5 gs.

Paper Details

Date Published: 18 November 1989
PDF: 2 pages
Proc. SPIE 1039, 13th Intl Conf on Infrared and Millimeter Waves, (18 November 1989); doi: 10.1117/12.978490
Show Author Affiliations
R. M. Gilgenbach, The University of Michigan (United States)
J. G. Wang, The University of Michigan (United States)
J. J. Choi, The University of Michigan (United States)
C. A. Outten, The University of Michigan (United States)
T. A. Spencer, The University of Michigan (United States)


Published in SPIE Proceedings Vol. 1039:
13th Intl Conf on Infrared and Millimeter Waves
Richard J. Temkin, Editor(s)

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