Share Email Print
cover

Proceedings Paper

A Universal Test Fixture For Characterizing Mm-Wave Solid State Devices Using A Novel Deembedding Procedure
Author(s): Robert R. Romanofsky; Kurt A. Shalkhauser
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The design and evaluation of a novel fixturing technique for characterizing mm-wave solid state devices, including monolithic microwave integrated circuits, is presented. The technique utilizes a cosine tapered ridge guide fixture and a one-tier deembedding procedure to provide accurate and repeatable device level data. Advanced features include "nondestructive" testing, full waveguide bandwidth operation, a high degree of universalism, and rapid yet repeatable chip-level characterization. Furthermore, only one set of calibration standards is required regardless of device geometry.

Paper Details

Date Published: 18 November 1989
PDF: 2 pages
Proc. SPIE 1039, 13th Intl Conf on Infrared and Millimeter Waves, (18 November 1989); doi: 10.1117/12.978455
Show Author Affiliations
Robert R. Romanofsky, Lewis Research. Center (United States)
Kurt A. Shalkhauser, Lewis Research. Center (United States)


Published in SPIE Proceedings Vol. 1039:
13th Intl Conf on Infrared and Millimeter Waves
Richard J. Temkin, Editor(s)

© SPIE. Terms of Use
Back to Top