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Proceedings Paper

On The Work Mechanism Of MIM Point Contact Diode
Author(s): N. Ioli; A. Moretti; D. Pereira; M. Prevedelli; F. Strumia; G. Carelli
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Paper Abstract

Many theoretical and experimental stuidies have been reported (1,2) on the metal-insulator-metal (MIM) point contact diode as a device to measure infrared optical frequencies. Electron tunnelling is the most widely accepted explanation for the extremely broadband response of MIM diodes. However, there is evidence for at least one more phenomenon, slower and possibly of thermal origin, occurring in the diode (3); this effect could be responsible of a masking effect particularly important near visible frequencies (2), where the absorption of the metals becomes greater, and tentatively contributes tc opposite polarity video detection at visible wavelengths (4). Purpose of the present work was to perform a systematic investigation on a W-Ni MIM point contact diode at different IR and FIR wavelengths. Results will be discussed which yield the determination of a cutoff for the slow mechanism and clearly demonstrate the suggested thermal origin of the effect.

Paper Details

Date Published: 18 November 1989
PDF: 2 pages
Proc. SPIE 1039, 13th Intl Conf on Infrared and Millimeter Waves, (18 November 1989); doi: 10.1117/12.978415
Show Author Affiliations
N. Ioli, University of Pisa (Italy)
A. Moretti, University of Pisa (Italy)
D. Pereira, University of Napoli (Italy)
M. Prevedelli, University of Pisa (Italy)
F. Strumia, University of Pisa (Italy)
G. Carelli, University of Pisa (Italy)


Published in SPIE Proceedings Vol. 1039:
13th Intl Conf on Infrared and Millimeter Waves
Richard J. Temkin, Editor(s)

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