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Proceedings Paper

Development of a portable ESPI system for the analysis in situ of mural paintings
Author(s): E. Boaglio; J. Lamas; Ana J. López; A. Ramil; L. Pereira; B. Prieto; B. Silva
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Paper Abstract

The use of Electronic Speckle Pattern Interferometry (ESPI) is well documented in the literature as a non-destructive technique for structural diagnostics in the field of cultural heritage.. In the case of mural paintings the lack of adhesion between the plaster and the mural support is one of the most important risk factors that threaten their conservation. With this non-invasive method it is possible to detect detachments and cracks in the paintings before they become visible The objective of this work is the development of ESPI portable equipment based on a fibre interferometer for in situ qualitative analysis of mural paintings. The novelty of the presented set up is the use of a variable ratio coupler which makes the system more immune to vibrations and allows for better use of available light compared with the equivalent of free air guided. This configuration simplifies the arrangement and makes it possible to obtain ESPI interferograms with high contrast; moreover, the use of a ceramic heater as excitation source enables the analysis during the heating. Preliminary results obtained in laboratory conditions have shown that detachments and cracks can be successfully detected on model samples of the wall paintings.

Paper Details

Date Published: 11 September 2012
PDF: 6 pages
Proc. SPIE 8413, Speckle 2012: V International Conference on Speckle Metrology, 841314 (11 September 2012); doi: 10.1117/12.978263
Show Author Affiliations
E. Boaglio, Univ. da Coruña (Spain)
J. Lamas, Univ. da Coruña (Spain)
Ana J. López, Univ. da Coruña (Spain)
A. Ramil, Univ. da Coruña (Spain)
L. Pereira, Univ. de Santiago de Compostela (Spain)
B. Prieto, Univ. de Santiago de Compostela (Spain)
B. Silva, Univ. de Santiago de Compostela (Spain)


Published in SPIE Proceedings Vol. 8413:
Speckle 2012: V International Conference on Speckle Metrology
Ángel Fernandez Doval; Cristina Trillo, Editor(s)

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