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Proceedings Paper

Compact star simulator with very high accuracy
Author(s): Gao-fei Sun; Guo-yu Zhang; Ling-yun Wang; Shi Su; Yun Fu; Yu-jun Gao; Xiang-dong Wang
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Paper Abstract

In order to carry out on site calibration and accuracy test of a high accuracy star sensor, a type of compact very high accuracy star simulator system is needed, and its accuracy should be less than 0.2″. Firstly, we should study on the optical system with high imaging precision. Then, put a high-precision and large size star board on the star display system, in a static form to simulate dynamic star map. Finally, we should design the structure for star simulator according to parameters of optical system, to ensure installation accuracy and reliability of lens. The result shows that all of design indexes meet the requirement, and accuracy better than 0.2″, so star simulator proposed in this paper is satisfied for on site calibration and accuracy test of the high accuracy star sensor.

Paper Details

Date Published: 15 October 2012
PDF: 4 pages
Proc. SPIE 8417, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 84171J (15 October 2012); doi: 10.1117/12.978234
Show Author Affiliations
Gao-fei Sun, Changchun Univ. of Science and Technology (China)
Guo-yu Zhang, Changchun Univ. of Science and Technology (China)
Jilin Province Engineering Research Ctr. (China)
Ling-yun Wang, Changchun Univ. of Science and Technology (China)
Jilin Province Engineering Research Ctr. (China)
Shi Su, Changchun Univ. of Science and Technology (China)
Jilin Province Engineering Research Ctr. (China)
Yun Fu, Changchun Univ. of Science and Technology (China)
Jilin Province Engineering Research Ctr. (China)
Yu-jun Gao, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Xiang-dong Wang, Jinxi Industries Group Co. Ltd. (China)


Published in SPIE Proceedings Vol. 8417:
6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; Libin Xiang; Sandy To, Editor(s)

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